The Overlooked Value of Test-time Reference Sets in Visual Place Recognition

M. Zaffar, L. Nan, S. Scherer, J.F.P. Kooij, Proceedings of the IEEE/CVF International Conference on Computer Vision (ICCV) Workshops, pp. 7234-7243, 2025.
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Cite this work

@inproceedings{rsf,
    title={{The Overlooked Value of Test-time Reference Sets in Visual Place Recognition}},
    authors={M. Zaffar and L. Nan and S. Scherer and J.F.P. Kooij},
    booktitle={Proceedings of the IEEE/CVF International Conference on Computer Vision (ICCV) Workshops},
    pages={7234-7243},
    year={2025},
    doi={},
}